In the field of low-light imaging research, the sensitivity, readout noise, frame rate, and data transmission efficiency of sCMOS cameras are key factors determining the success of scientific imaging experiments. The 2nd-generation back-illuminated (BSI) sCMOS camera Gloria 6504, independently developed by Agile Device, has achieved breakthroughs in multiple core performance indicators, providing a powerful imaging tool for applications such as life sciences, astronomical observation, quantum physics, and semiconductor inspection.
The 2nd-generation Gloria 6504 achieves a frame rate of up to 300 fps at full resolution (2048×2048) in 12-bit STD HG mode. Even in 16-bit HDR high dynamic range mode, it still supports high-speed acquisition of 170 fps (via CXP interface) or 112 fps (via USB interface).
This performance leap is mainly attributed to the new pixel architecture and dual-gain readout circuit design of the 2nd-generation BSI sensor. Meanwhile, engineers at Agile Device optimized the parallel data channels to improve charge transfer efficiency and ADC conversion speed, and adopted a low-latency signal processing link inside the camera to ensure stable output of high-speed data streams.
In experiments requiring millisecond-level capture of dynamic processes, such as live cell dynamic observation and cold atom movement, the 2nd-generation scientific camera with high frame rate can fully record rapidly evolving processes, reduce motion blur, and significantly shorten the high-throughput screening cycle.
Figure 2: Flow Cytometer
Figure 3: Readout Noise Comparison Between 1st-Gen and 2nd-Gen Back-Illuminated sCMOS Cameras
The median readout noise of Gloria 6504 is only 0.7 e-, and it can be customized to as low as 0.4 e-, achieving "sub-electron level" noise control.
The 2nd-generation BSI chip adopts an all-new pixel structure design, optimizes charge-voltage conversion nodes, and uses a dedicated low-noise amplifier structure, effectively suppressing thermal noise and reset noise in the source follower and column readout circuits. These technological breakthroughs enable the Revealer Gloria 6504 sCMOS camera to enhance the capture capability of extremely weak signals in low-light experimental scenarios such as single-molecule fluorescence imaging, obtaining high signal-to-noise ratio images without enabling Binning mode.
Figure 4: Single-Molecule Fluorescence Imaging
The key to this technological breakthrough lies in two aspects: first, the 2nd-generation BSI chip improves the purity of silicon-based materials, optimizes the back passivation layer process, and introduces a more efficient deep potential well design, fundamentally suppressing the generation of hot electrons.
Second, engineers at Agile Device built a TEC deep cooling module (supporting both air cooling and water cooling) inside the camera. Through sealing technology and heat dissipation optimization, it effectively suppresses the generation of thermal noise.
Low dark current eliminates the need for frequent dark field correction in applications requiring exposure times of tens of seconds or even minutes, such as deep-space astronomical observation and biological bioluminescence detection, improving experimental efficiency.
Figure 6: Zebrafish Imaging
The interface of the 2nd-generation sCMOS camera adopts the USB 3.2 Gen2 protocol, integrated with Agile Device's self-developed high-speed cache and multi-channel data transmission technology, giving full play to the high throughput capacity of USB 3.2 Gen2.
For most life science experiments, the USB interface offers plug-and-play convenience and strong compatibility. Users do not need to configure additional dedicated CoaXPress acquisition cards, and can complete high-speed image acquisition only through a USB cable, reducing experimental complexity.
As a 2nd-generation back-illuminated cooled sCMOS camera, the Gloria 6504 achieves performance leaps in four aspects: frame rate, readout noise, dark current, and transmission speed. It provides researchers in the fields of life sciences, quantum research, space observation, and semiconductor inspection with a more competitive scientific imaging solution.
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